Adrian Chasin

Adrian Chasin is a Principal Member of Technical Staff (PMTS) and the R&D team leader of the FEOL Reliability team at imec. He is involved in several logic/memory projects ranging from advanced devices architectures through new memory concepts to use of non-conventional semiconducting materials. He received the PhD in Electrical Engineering from the University of Leuven in 2014 under the supervision of Prof. Paul Heremans, when he developed devices based on new semiconducting oxides for display and flexible electronics targeting RF applications. After working at NXP on modelling/evaluation of CMOS technologies, he joined the imec reliability group in 2015 as a researcher. His main research interests are FEOL/MOL reliability in advanced CMOS technologies and thin-film devices for memory and BEOL applications. He authored and co-authored more than 150 publications.