Robert Geer

Robert Geer - Professor of Nanoscale Science, College of Nanoscale Science and Engineering (CNSE), Suny Polytechnic Institute
Robert Geer is a Professor of Nanoscale Science in SUNY Polytechnic Institute’s College of Nanoscale Science and Engineering (CNSE).  Professor Geer is the Executive Director of the NSF-funded Northeast Advanced Technological Education Center (NEATEC) based at NYCREATES’ 300mm Si wafer prototyping facility. Professor Geer also serves as the Director of Education and Workforce Development for AIM Photonics, a Manufacturing-USA institute. Professor Geer’s team develops and promotes advanced education and training program development for the U.S. semiconductor, integrated photonics, and nanotechnology manufacturing industries. He has led the development of a range of workforce training programs for the semiconductor industry including technician training programs for several chip manufacturers and toolmakers.  Professor Geer’s education-development team has also recently founded a DoD SkillBridge training program, the VET Semiconductor Training and Experience Program (VET S.T.E.P.) to provide skills to transitioning U.S. military personnel for semiconductor manufacturing. In addition, Prof. Geer has led a wide range of research programs at SUNY Poly which include design, development and fabrication of novel 3D integrated circuits, investigation of variability and manufacturability of integrated photonics devices and structures, reliability of resistive RAM, development of graphene for next-generation interconnects, Si-based nanowire materials for energy applications and integrated circuits, and development of nanoscale metrology tools for measurement and characterization of nanodevice structures. His research has been supported by: NSF, GlobalFoundries, IBM, AMD, ONR, the New York State Office of Academic Research and Technology, International Sematech, AFOSR, DARPA, and the SRC. Professor Geer has presented over 75 papers at technical conferences and has published more than 100 articles, book chapters, or proceedings on nanoscale materials, devices, and nanoscale characterization.